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Wafer supplier's growth reflects development of 300mm wafer industry

Posted: 07 Jun 2006 ?? ?Print Version ?Bookmark and Share

Keywords:production wafer quality certification? process control system? ADE?

ADE Corp. announced that it has received a multi-million dollar order for 300mm production wafer quality certification and process control systems; including wafer geometry measurement, surface inspection and defect classification, and the new FabVision yield management and database system, from a semiconductor wafer supplier. Delivery of these tools is expected to be completed in 2006 to support the customer's first 300mm wafer production fab in the United States.

"This order continues to reflect the growth of 300mm wafer capacity and represents the first expansion of 300mm silicon wafer production in the United States," said Chris L. Koliopoulos, ADE's president and chief executive officer. "Through the adoption of this tool set by this wafer supplier, ADE is committed to help the customer ramp up 300mm wafer production to achieve its yield entitlements for this initial investment in the United States."

Gartner Dataquest predicts that 300mm wafer demand will grow by 41 percent in 2006 and by an additional 20 percent in 2007. Nineteen new 300mm semiconductor device fabs are planned either to begin or to ramp production between 2006 and 2008.

ADE's production metrology and inspection equipment is said to enable high yield with low cost of ownership and a smooth transition between technology nodes for wafer suppliers, incoming quality control and semiconductor equipment manufacturers.




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