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New DFM methods enable early yield prediction

Posted: 18 Sep 2006 ?? ?Print Version ?Bookmark and Share

Keywords:Lee Yeong Bin? Mentor Graphics? design for manufacturing? DFM? random defects?

New DFM methodologies such as RRA and CAA, combined with traditional DRC and accurate fab yield impact data, enable designers to determine whether design modifications actually result in higher-yielding silicon.

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