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Agilent adds test option to accelerate yield ramp-up phase

Posted: 05 Oct 2006 ?? ?Print Version ?Bookmark and Share

Keywords:Agilent? N9201A? parametric tester? tester? chip testing?

Agilent Technologies Inc. has announced a new parametric test option that claims to accelerate the yield ramp-up phase for IC makers. The N9201A is an option for the company's parametric testers. The product provides a per-channel source/monitor unit (SMU) architecture. It supports up to 40 total SMUs, five times more than previously available units in a single tester.

Geared for fast characterization of in-line array test structures, the N9201A features an address generation function, allowing engineers to do advanced array matrix testing.

"Time-to-yield is becoming a more critical factor for business success at 90nm process technology and below," said Minoru Ebihara, vice president and general manager of Agilent's Hachioji Semiconductor Test Division, in a statement. "High volume parametric data is needed to shorten the cycle time required to ramp up a wafer fab to full production. With the unprecedented measurement capabilities provided by the new N9201A, customers using the Agilent 4070 series testers can efficiently perform parametric test in this critical yield ramp-up phase."

The N9201A Array Structure Parametric test option for Agilent's 4070 parametric test systems can be ordered now, with configurations from 8 to 40 SMUs. Pricing for the N9201A option starts at $150,000 for an 8 SMU configuration.

- Mark LaPedus
EE Times

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