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Do timely testing to avoid cosmic ray damage

Posted: 01 Jan 2007 ?? ?Print Version ?Bookmark and Share

Keywords:MOSAID Systems Inc.? synchronous dynamic RAM? SDRAM? soft error rate? SER?

Modern memory devices exhibit significant and increasing sensitivity to radiation-induced errors. Accurate measurements and comparisons of radiation sensitivities of semiconductor memory devices require the control of test conditions commensurate with the complexity of the devices.

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