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STARC to use Mentor's analyzer tool for DFM flow

Posted: 26 Jan 2007 ?? ?Print Version ?Bookmark and Share

Keywords:Mentor Graphics? analyzer?

Research consortium Semiconductor Technology Academic Research Center (STARC) will standardize on Mentor Graphics Corp.'s Calibre YieldAnalyzer for critical area analysis (CAA) in their DFM flow. STARC will use Calibre YieldAnalyzer's CAA tool to develop yield-aware design methodology as a part of its STARCAD-CEL (One step ahead of DFM) project.

The move to 90nm and 65nm nodes is increasing manufacturing cost. To solve this, STARC aims to use Mentor's CAA tool to achieve robust design patterns with its capacity for yield prediction prior to manufacturing accomplished by accurate extraction of CAA data from the layout and application of an optimized model that considers different yield densities for each process.

"From evaluation results, we have found that Calibre YieldAnalyzer delivers highly accurate critical area extraction," said Nobuyuki Nishiguchi, vice president and general manager, Development Dept.-1 at STARC. "We are going to use this tool not only for critical area extraction and yield prediction, but also as a reference tool to enable more effective design enhancement."

"We are pleased that Calibre YieldAnalyzer achieves STARC's requirements for highly accurate CAA extraction. We look forward to jointly delivering an effective solution to our mutual customers through the adoption of Calibre YieldAnalyzer," said Patrick Williams, corporate VP, Mentor Graphics Japan.

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