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IEEE okays Synopsys' SPEF proposal

Posted: 05 Feb 2007 ?? ?Print Version ?Bookmark and Share

Keywords:Synopsys? SPEF? IEEE 1481?

The IEEE 1481 working group has approved Synopsys Inc.'s proposal for an extension to the standard parasitic exchange format (SPEF) for process and temperature variation. The proposal enhances the existing IEEE standard 1481-1999 for SPEF by providing a common medium to pass sensitivity-based parasitic information between EDA tools. It includes key extensions that accurately and concisely represent interconnect parasitic sensitivity information required for sub-65nm processes.

The draft standard for the SPEF extension is now pending balloting and approval by the IEEE standards board.

Comments Rich Goldman, VP of strategic market development at Synopsys, "The SPEF extension is critical to address the emerging process- and temperature-variation challenges for sub-65nm designs. By proactively working with the IEEE 1481 working group and driving a single sensitivity-based SPEF standard, Synopsys has demonstrated its commitment to further openness and interoperability in the electronics industry."

According to Synopsys, a standard sensitivity-based SPEF format will enable parasitic extraction tools to create a netlist with nominal values of parasitics and their sensitivities to interconnect process parameters, which can then be easily read by analysis, simulation and implementation tools.

"An industry-standard SPEF format with the sensitivity extension is invaluable for our designs at 65nm," said Adrian Hartog, senior VP at AMD. "A common standard will allow us to seamlessly leverage various EDA tools that support the new format in our statistical design flow. We applaud Synopsys' proposal to advance interoperability in the industry and look forward to its adoption as an industry-wide standard."

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