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Conquer loss, create high-yielding designs

Posted: 01 Mar 2007 ?? ?Print Version ?Bookmark and Share

Keywords:yield loss mechanisms? lithographic sensitivity? poor surface planarity and sensitivity to random particle defects? design-for-yield techniques? new approach to higher-yielding silicon?

This article discusses the three most important yield-loss mechanisms in 65nm designs, and proposed methods for mitigating yield loss without severe impact on design schedules. Using tools that are both powerful and well-integrated, design and layout engineers can create high-yielding designs while meeting design specifications and demanding schedules.

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