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Solve complexity issues in 4-port RF designs

Posted: 02 Jul 2007 ?? ?Print Version ?Bookmark and Share

Keywords:RF device measurement? 4-port RF device? RF measurement?

There is an increasing need for engineers to characterize high-speed semiconductor devices that use the new differential or 4-port RF design architecture. Such architecture is prevalent in today's high-speed wireless products.

For RF measurements on 4-port designs, engineers need to validate and calibrate their RF test system on four ports instead of two. But the addition of two more ports is not just the sum of 2+2. Complexity and problems expand exponentially. Further, until now, advanced "probing-tolerant" 4-port calibrations did not exist.

In this article, Larry Dangremond of Cascade Microtech shows us how to solve complexity issues arising from the measurement of 4-port devices and to ensure RF test system calibration is accurate, reliable and repeatable.

View the PDF document for more information.




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