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JTAG unrolls CFM for Teradyne in-circuit testers

Posted: 01 Aug 2007 ?? ?Print Version ?Bookmark and Share

Keywords:boundary-scan controller? in-system programming? HW/SW solution?

JTAG Technologies has announced the availability of the JT 2147 Custom Function Module (CFM) for use with its Symphony 228xPLUS integration package for Teradyne's TestStationT in-circuit testers (ICT). With the availability of the JT 2147 CFM, existing TestStation and previous generation 228x systems can be easily upgraded with a JTAG Technologies boundary-scan controller to handle the most demanding test and in-system programming demands.

The JT 2147 CFM provides a superior means of incorporating a boundary-scan TAP POD into the ICT system. Two CFMs can be installed on the Teradyne Custom Function Board (CFB), which provides ground isolation and also contains a switching matrix to route TAP signals to pins on the test fixture. The low profile of the CFM ensures an easy fit of the CFB into the test system.

Users benefit from off-line, fixtureless test preparation and the re-use of standalone applications at other stages of the product life cycle such as prototyping and field service, by porting JTAG Technologies' applications across different development and execution environments. Moreover, the combination of ICT and boundary-scan draws on the strengths of both technologies and achieves excellent cost-ffectiveness through reduced test fixture complexity.

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