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Debugger detects hardware problems 'on the floor'

Posted: 03 Aug 2007 ?? ?Print Version ?Bookmark and Share

Keywords:manufacturing process? one-chip debugging solution? testing solution?

Wind River Systems Inc. has released the On-Chip Debugging for Manufacturing and Test, a standards-based offering that allows test and manufacturing engineers to diagnose hardware problems on the manufacturing floor.

The new solution enables manufacturing organizations to increase production line throughput, validate and verify finished products more effectively, reduce scrap and rework, and easily create custom test applications for their individual needs. It also complements and extends an organization?s existing investment in tools such as boundary scanners, logics analyzers and oscilloscopes.

In addition, the Wind River solution combines the company's on-chip debugging-based development solutions together with specific test and manufacturing tooling and pre-integration with the National Instruments (NI) LabVIEW platform and development environment. Specifically, Wind River On-Chip Debugging for Manufacturing and Test includes Wind River ICE and Wind River Probe emulator products, Wind River On-Chip Debugging API and Utility JTAG testing solution, and the NI LabVIEW Virtual Instrument Driver.

Used collectively, the solution enables manufacturing organizations to streamline the testing process in manufacturing; shorten the manufacturing debug process; simplify the creation of elaborate test and automation systems, reducing test/manufacturing costs and improving manufacturing cycle time; and use automated tests that deliver consistent and predictable results.

Wind River On-Chip Debugging Utility also includes specific enhancements such as memory upload utility, which allows developers to select a specific area of memory on the target and extract data into a file saved in the Host PC file system. This feature allows test and manufacturing engineers to load and run test scripts on their targets, capture the results stored in specific areas of memory and store the results for future reference and analysis.

It also includes enhanced virtual instruments (VIs) support with National Instruments LabVIEW through the creation of ?Higher-Level? VIs, which enable LabVIEW users to more easily create their own custom test applications.

The solution also supports a wide range of processors and architectures, expanding to multicore devices with the support of the following processors: Broadcom Sibyte, Intel XScale, Freescale and PA Semi.

"With the complexity of embedded device manufacturing today, the value in complementing existing production test management plans with on-chip debugging is growing," said Greg Crouch, embedded systems business director at NI. "One such trend is the need for solutions that combine flash programming, on-chip software test and verification for device functionality and defect resolution. Through integration with our LabVIEW offering, Wind River On-Chip Debugging extends LabVIEW's powerful test management capabilities and advanced reporting mechanisms, thus enabling our joint customers to deliver products to market quicker and more efficiently."

"Wind River recognizes that the increasing complexity of embedded device development spans the entire product development life cycle, including Manufacturing and Test," said Sandy Orlando, VP and general manager of on-chip debugging at Wind River. "Through the use of On-Chip Debugging for Manufacturing and Test, our customers should be able to increase manufacturing throughput by enabling more thorough testing in a shorter amount of time, resulting in the identification and resolution of defects late in the manufacturing process, decreasing scrap inventory, and reducing manufacturing costs."

Wind River will be participating at the 7th Embedded Systems Conference-Taiwan (ESC-Taiwan) and the 15th EDA & Test-Taiwan Conference & Exhibition (EDA&T-Taiwan on August 23-24 at Taipei International Convention Center.

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