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Instruments advance chip test productivity

Posted: 19 Sep 2007 ?? ?Print Version ?Bookmark and Share

Keywords:parametric analysis? optoelectronic components? semiconductor characterization?

Keithley Instruments has expanded its product line for semiconductor characterization and production tests. New models of its series 2600 allow measurements of extremely low currents while at the same time reducing costs, the company claimed.

Designed for parametric analysis and tests of semiconductors, the models 2635 and 2636 offer resolutions in the femtoampere (10-15A) rangea feature that is frequently required for measurements of semiconductors and optoelectronic components. A built-in script processor enables users to implement complex test procedures in research and production environments as well as in wafer classification, semiconductor characterization or reliability testing.

According to the vendor, the multi-channel architecture allows users to increase their productivity and lower the costs by as much as 50 percent, compared to mainframe-based source meter solutions.

The systems offer the functionality of several measurement instruments, the company said, including Source-Measure Unit (SMU), digital multimeter, precision voltage source, pulse generator and arbitrary waveform generator. While they can be coupled with a PC for DAQ and sequence control, they also can work standalone and automatically perform complex test sequences which can be programmed in a script language similar to Basic.

- Christoph Hammerschmidt
EE Times Europe

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