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MPV DIOS module enhances PCB testing

Posted: 12 Oct 2007 ?? ?Print Version ?Bookmark and Share

Keywords:voltage I/O module? PCB testing? multi-programmable I/O?

JTAG Technologies has released the JT 2111/multiprogrammable voltage (MPV) digital I/O scan (DIOS) module, which retains a legacy form-factor and default settings but adds programmable voltages to facilitate the enhanced testing of complex PCBs.

When connected to a circuit board via edge connector or fixture test pins the module enhances regular interconnect tests by exercising the board's connections in synchronization with native boundary-scan components. The JT 2111 features PLDs and a 10MHz oscillator, so can be programmed to perform more custom functional and pattern tests.

The module's hot-swap feature offers improved test throughput by allowing test targets to be connected/disconnected from the fixture without cycling power. Also, 100 percent backward compatibility with previous versions is ensured by simulation of the former DIOS devices. Both output and input thresholds can be programmed to 1.5-, 1.8-, 2.5- or 3.3V making the module suited to testing modern low-voltage logic families. The I/O channels are grouped into blocks of 16 channels and, to reduce scan chain length and improve test efficiency, any number of 16-channel groups can be bypassed.

In addition, selected channels can be interfaced with custom cabling to the board under test (low volume apps) or interfaced with bed-of-nails fixtures for higher volume production. The I/O channels are individually programmable as input, output, bi-directional or tri-state signals. Up to 10 JT 2111/MPV DIOS modules can be daisy-chained together to provide a massive 640 I/O channel count.

"The JT 2111/MPV DIOS is extremely versatile and offers a low-cost and modular method for adding JTAG compliant I/O to any test strategy," said Peter van den Eijnden, JTAG managing director.

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