Global Sources
EE Times-Asia
Stay in touch with EE Times Asia
EE Times-Asia > T&M

Consortium drafts IC test interface extension standard

Posted: 22 Oct 2007 ?? ?Print Version ?Bookmark and Share

Keywords:STIX initiative? automated test equipment? IC supply?

The Semiconductor Test Consortium Inc. (STC) announced that its Docking & Interface Working Group (DIWG) has published the first draft of terminology specifications for the Semiconductor Test Interface eXtensions (STIX) initiative.

The consortium will also organize key activities related to the STIX initiative at the International Test Conference (ITC) including working group meetings, as well as a booth presence and the annual consortium dinner event. Both efforts build on the strong momentum around the STIX initiative, which is aimed at addressing rising cost and efficiency challenges in the ATE arena, through the collaborative efforts of companies spanning the IC supply chain.

Successful standardization of terminology specifications promises to increase supply chain efficiencies and reduce the risks arising from miscommunications between design, manufacturing, sales and purchasing personnel.

DIWG has established standard terminologies in the critical, interface-related areas, including the X-Y-Z axes with respect to testhead orientation, convention for contact sight numbering, minimum set of docking interface connections, and defining the various interface levels for the testhead, loadboard, contactor and handler. In order to tackle such a wide range of subjects expeditiously the group split into five task-force teamsprober, handler, docking and interface, tester and manipulator.

"The Docking & Interface Working Group showcases the impressive progress being realized at STC by leveraging cohesive multi-national working groups on a regional basis," said Bob Helsel, STC manager. "To quickly tackle the full scope of their project, five teams were established from 24 working group members representing 14 companies. Efforts were coordinated and initial results published in less than a year. This level of cooperation and progress highlights the commitment the test industry is making to the STIX initiative."

Article Comments - Consortium drafts IC test interface ...
*? You can enter [0] more charecters.
*Verify code:


Visit Asia Webinars to learn about the latest in technology and get practical design tips.

Back to Top