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Test system reduces cost of SoC testing

Posted: 11 Dec 2007 ?? ?Print Version ?Bookmark and Share

Keywords:SoC testing? flash memory? digital test?

Advantest Corp. has introduced a compact test solution designed to lower the cost of testing SoC devices used in digital consumer products and automotive electronics. The test solution is comprised of the newly developed T2000 GS mainframe test system and the 250MDMA module for digital test, which enables parallel testing of SoC devices on the OPENSTAR-compliant T2000 test platform.

The T2000 GS compact test system in combination with the 250MDMA module are aimed at both high-mix, low-volume and general-purpose SoC devices. The T2000GS mainframe offers a 13-slot test head and half the footprint of its predecessor. Its air-cooling design is said to improve operational flexibility, allowing more options for installation configurations and easier maintenance. When used in combination with other test modules already available, it offers a wide range of test solutions on a single tester.

The 250MDMA air-cooled digital test module for high-parallel test of SoC devices offers 128 channels per module and test speeds of 250Mbit/s. The module provides a 32-device parallel test when combined with the T2000 GS mainframe and a 64-device parallel test when combined with the T2000 LS mainframe.

The 250MDMA is equipped with a "histogram engine", which performs ADC data enumeration and precision analysis. This feature significantly shortens turn-around time by accumulating test data in the hardware module, thus reducing the amount of information that must be transferred to the controller for analysis, and significantly reducing the time required for analysis, according to Advantest.

The 250MDMA is offered with a wide range of functions including a high-voltage output driver for built-in flash memory, a SCAN pattern generator, and an ALPG pattern generator. It also supports multi-time domain operation.

The T2000 GS mainframe and the 250MDMA digital module will be available in March 2008.

- Gina Roos
eeProductCenter




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