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Automatic system for IC characterization: The DC approach

Posted: 16 May 2008 ?? ?Print Version ?Bookmark and Share

Keywords:CY8C27xxx application note? IC characterization? DC approach?

In electronic design laboratories, mainly in electronics teaching centers, it is mandatory to use analysis or design tools and reliable procedures to do automatic IC testing. In practice, the test procedure is not only useful to verify the circuit�s performance but also to corroborate the sequence of the proposed test vectors or any other proposal for analog testing. Further, a friendly control panel with multifunction keywords is always welcome. Until now, the designed functions are for analog purposes, where the IC characterization includes voltage and current measurements. These variables at DC level are needed to ensure the operation point of the design. Because analog design requires specific voltage and currents in several nodes or branches, using correct procedures to check them allows the designer to verify the entire design�s performance, that is, DC and AC characteristics. In this application note, E. Montoya-Su�rez, F. Sandoval-Ibarra present the first version of their academic system for automatic IC characterization. The ICs under study are academic projects that are manufactured according to the design rules of a standard 1.5m CMOS process, N-well, two poly/metal layers, and 0-5V. However, to show the capabilities of the proposed system, commercial components are used to develop additional processing functions and also to display their corresponding DC characteristics.

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