Global Sources
EE Times-Asia
Stay in touch with EE Times Asia
?
EE Times-Asia > Networks
?
?
Networks??

Auto ICs new design seeks zero defects

Posted: 05 Jun 2008 ?? ?Print Version ?Bookmark and Share

Keywords:IC? design? ASIC? automotive systems?

The automotive industry is pushing for fewer defects in chip designs, prompting the need for a new ASIC methodology.

"There is a move toward 'zero defects' in ASICs within automotive systems," said Valentin von Tils, VP, ASIC development, Robert Bosch GmbH.

Bosch itself is deploying a predictive concept called design for zero-defects (DfZD) to achieve that goal, but there are some major challenges.

"The problem is that the automotive industry is migrating toward more complex SoC designs, which are running in more difficult operating environments," he said in a keynote address at the recent IEEE 2008 International Interconnect Technology Conference.

"At some point, discrete components will migrate toward SoCs as a means to lower costs. Electronic control units will be merged into domain controllers to host several functionalities,'' he added, noting that, ''Sensors will be clustered and/or integrated into controllers."

Bosch itself is moving toward what it calls combined active and passive safety system, which is integrated on the same device.

Therefore, an innovative design mindset is required. "A new, integrated design processwhich covers all aspects of design, manufacturing, testing, lifetime-related stress and experiences from former designsis required," Bosch said.

"As a result, Bosch shifting toward DfZD encompasses several disciplines such as design-for-test (DFT), design-for-manufacturing and design-for-quality," he added.

It also goes beyond the two traditional quality-control methodologies: statistical and single events. Statistics involves Pareto analysis, process capabilities and test coverage. Single events involve stress tests, DFT and root cause analysis.

To accomplish zero defects, Bosch is deploying proactive types of technologies such as failure tolerance, redundancy and applications engineering.

- Mark LaPedus
EE Times





Article Comments - Auto ICs new design seeks zero defec...
Comments:??
*? You can enter [0] more charecters.
*Verify code:
?
?
Webinars

Seminars

Visit Asia Webinars to learn about the latest in technology and get practical design tips.

?
?
Back to Top