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ZIF probe tips handle DDR, GDDR validation

Posted: 15 Jan 2009 ?? ?Print Version ?Bookmark and Share

Keywords:probe tip? ZIF long wire? memory validation? DDR?

Agilent Technologies Inc. and Hynix Semiconductor Inc. have developed a high-bandwidth, high-performance long-wire zero insertion force (ZIF) probe tip optimized for DDR and GDDR SDRAM validation.

The long-wire ZIF tip allows engineers to make accurate measurements of high-speed signals when they probe signals located farther apart. These tips are used with Agilent's InfiniiMax and ZIF probing system, which offers improved usability and lower cost per solder attachment.

The probing option addresses one of the basic challenges of DDR design: It allows engineers to probe hard-to-reach locations on a DRAM chip while maintaining signal integrity. As the speed of DDR and GDDR SDRAM devices increases, and the design margins become smaller, the performance of the probing system becomes ever more critical. The long-wire ZIF tip addresses this probing challenge.

Another challenge with DDR and GDDR validation is the number of signals that need to be tested for JEDEC specifications. The design of the long-wire ZIP tip allows engineers to easily switch between the multiple signals they need to probe on a SDRAM device.

This product fulfills the complete compliance testing requirements for DDR memory designs.

"We liked the performance of Agilent's original ZIF tip accessories, but we wanted the tips to be longer and more flexible so we can access signals that are farther apart," said Kun-Sang Yoon, VP of Hynix's graphics memory application team. "Agilent took our feedback and quickly came back with the probing solution that meets our needs. The long-wire ZIF tip accessories maintain high signal-integrity performance, allowing us to accurately measure our high-speed signals."

"We keep a strong pulse on the needs of our customers," said Scott Sampl, VP and general manager of Agilent's oscilloscope product line. "Our experts work closely with industry leaders like Hynix and with the standards bodies. These relationships give us the ability to quickly respond to changes that will improve measurement efficiency and accuracy. We have the right toolsfrom BGA probing technology to compliance software applicationsto help engineers validate their DDR and GDDR memory designs quickly."

The U.S. list price for the N5451A InfiniiMax differential long-wire ZIF tips is $467 for a kit of 10 ZIF probe tip accessories. The probe accessory is available now.





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