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Source measurement handles up to nanoamp levels

Posted: 16 Sep 2009 ?? ?Print Version ?Bookmark and Share

Keywords:l source measure unit? Agilent SMU? USB?

FPDK12SR8003PSS

Agilent Technologies Inc. is offering a three-channel source measure unit (SMU) that simultaneously provides power and performs measurements in semiconductor devices such as parametric testing of diodes, LEDs and CMOS ICs. The improved throughput of the U2723A saves time, while its compact size saves benchtop space. It is the latest addition to Agilent's family of paperback-sized USB modular instruments.

The compact U2723A, which supplies voltage (20V) and current (120mA) on all three channels, can operate in four-quadrant mode and also provides accurate current measurements down to nanoamp levels. With 15ms rise time, the SMU improves throughput, especially during mass testing of semiconductor devices. It also simplifies automated testing with up to two embedded test scripts per channel.

"With just one U2723A, our customers in the semiconductor industry can quickly obtain reliable power and get accurate measurements without spending too much time or effort on programming," said Ee Huei Sin, VP and general manager of Agilent's basic instruments division. "Because the SMU is so fast and packs so much capability into a small space, we often describe it as the SMU that helps our customers conquer space and time."

The Agilent U2723A can be used as a standalone instrument or as a module plugged into the compact U2781A USB modular-products chassis. For standalone use, the U2723A can be connected to a PC via USB, and testing can be performed with the bundled Agilent Measurement Manager (AMM) software. To simplify integration into new or existing test systems, AMM includes a code-conversion capability that translates commands into forms compatible with popular programming languages such as C#, C++, Agilent VEE and Microsoft Visual Basic.

The Agilent U2723A USB modular source measure unit is priced at $3,500 and is available now worldwide.

For application notes on source measurement units click here.





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