Global Sources
EE Times-Asia
Stay in touch with EE Times Asia
EE Times-Asia > RF/Microwave

PXI platform handles LTE tests

Posted: 20 Oct 2009 ?? ?Print Version ?Bookmark and Share

Keywords:LTE? PXI platform? software? network?

PXI 3000 platform

Aeroflex has the added Long Term Evolution (LTE) measurement capabilities to its flexible, modular PXI 3000 platform. The addition enables production test engineers to achieve faster time to volume for RF components and LTE user equipment..

Aeroflex's new measurement suite option for the PXI 3000 allows production test system engineers to use low-cost modular PXI equipment to characterize LTE terminals, chipsets and RF components. LTE terminals will feature the coexistence of LTE with legacy standards in the same device. Support for multiple cellular standards in a single test platform is key to improve production yield and reduce test times.

The new measurement suite is complemented by the new LTE waveform generation capabilities of Aeroflex IQCreator software, which supports the PXI 3000 series as well as the Aeroflex 3410 series of bench-top digital RF signal generators, making them ideal for LTE RF component test.

"The new LTE test support for the PXI 3000 series further strengthens Aeroflex's LTE test offering and complements our other test platforms such as the 3410 and 7100, enabling the fastest path from R&D to low cost manufacturing test and providing reduced risk in achieving the best time to volume," said Tim Carey, PXI product manager at Aeroflex.

Aeroflex's PXI 3000 and 7100 platforms share much in common, simplifying the migration from R&D to manufacturing. The same software algorithms underpin both platforms and comparable RF performance is achieved, so equipment used by R&D engineers will give results that correlate very well with measurements in the factory. This can eliminate delays that occur when a range of instrument types behave differently and require time-consuming troubleshooting to overcome the discrepancies.

Upcoming deployments of LTE networks around the world and a strong forecast in consumer demand for 4G services mean the ramp to volume manufacturing must be supported by a flexible test solution that will strengthen production output. The PXI 3000 platform achieves this by reducing test times and costs, enabling future capacity expansions while maintaining performance and accuracy levels comparable to that of the R&D system.

The new LTE FDD Measurement Suite for the PXI 3000 series enables characterization of LTE FDD signals in accordance with the requirements outlined in 3GPP Release 8. This allows LTE analysis of the SC-FDMA uplink and Aeroflex will soon be adding OFDMA downlink support as well. In addition to numerical measurement results, the measurement suite provides trace displays for spectrum emission mask, complementary cumulative distribution function, constellation plots, error-vector magnitude vs. carrier, and vs. symbol. Capabilities expand across the entire range of possible frequencies and bandwidths, from 1.4MHz to 20MHz, when used with any of Aeroflex's PXI modules.

IQCreator ver 8.10 is a Windows-based software application that enables a user to set up a modulation scheme and create an ARB file for use in conjunction with the PXI 3020 series modular signal generators and the 3410 series bench-top digital RF signal generators. IQCreator Version 8.10 adds complete LTE FDD support for the PXI 3000 series RF modular instrument and 3410 series digital signal generators enabling uplink and downlink LTE stimulus response measurements on components used in LTE based products.

IQCreator Version 8.10 is now available and can be downloaded from the Aeroflex website. Version 8.10 of IQCreator is shipping now with all new 3020 series PXI signal generator modules fitted with option 100.

For application notes on PXI platforms click here.

Article Comments - PXI platform handles LTE tests
*? You can enter [0] more charecters.
*Verify code:


Visit Asia Webinars to learn about the latest in technology and get practical design tips.

Back to Top