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Vector signal analyzer, generator improve test times

Posted: 28 Jan 2010 ?? ?Print Version ?Bookmark and Share

Keywords:wireless test? vector signal analyzer? vector signal generator? PXI Express?

NI vector signal analyzer, generator

National Instruments unveils two new PXI Express RF modular instruments for automated wireless device test. The NI PXIe-5663E 6.6GHz vector signal analyzer (VSA) and the NI PXIe-5673E 6.6GHz vector signal generator (VSG) improve automated test times for a wide range of devices. It uses the latest wireless standards including WLAN, WiMAX and GSM/Edge/W-CDMA. Their RF list mode feature provides deterministic power and frequency sequencing functionality to help engineers make RF configuration changes quickly during a test. A new wide-loop bandwidth mode further improves measurement speed by reducing local oscillator settling times down to 300?s or less.

"These new RF instruments illustrate our ongoing commitment to help test engineers save money by improving test times," said Eric Starkloff, VP of test product marketing at NI. "The increased performance of our enhanced 6.6GHz RF instruments directly addresses the need to perform automated RF tests faster than traditional solutions in high-volume production applications."

Using RF list mode, engineers can configure the new NI 6.6GHz PXI Express VSG and VSA to rapidly switch through a preprogrammed list of RF settings, including frequency and power level, at deterministic timing intervals. RF list mode also facilitates more accurate power measurements by helping engineers optimize the input reference level of the NI PXIe-5663E VSA.

In wide-loop bandwidth mode, the new VSG and VSA can settle to a center frequency significantly faster than many traditional RF instruments. They achieve typical tuning times of 300?s and 400?s for frequencies between 800MHz and 1,950MHz. With faster settling times, engineers can significantly reduce overall measurement time within automated RF test applications.

The enhanced NI 6.6GHz PXI Express RF instrumentation suite is based on the NI software-defined test platform, which incorporates industry-standard PC technologies such as multicore processors and PCIe instrument bus connectivity. The software-defined nature of the NI PXI RF modular instruments helps engineers use NI LabVIEW graphical system design software to define measurement algorithms for testing a variety of wireless devices at up to 5x to 10x faster than traditional RF instrumentation.

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