Memory test solution supports DDR3, DDR4

Verigy has introduced the V93000 HSM3G high-speed memory test solution that highlights future-ready upgradeability, enabling it to support testing of future generations of DDR memories with data-transfer rates up to 6.8Gbit/s.

It features programmable, at-speed APG per-pin with support for data bus inversion and cyclic redundancy check data generation. Verigy also claims the V93000 HSM3G provides test-time savings of up to 20 percent due to its memory ATE per-pin throughput. It is also said to deliver fully parallel pattern execution, fully parallel DC tests and eye-width measurements. The V93000 HSM3G achieves a native 2.9Gbit/s data rate and true 256-site DDR3 parallel testing over the entire speed range.