Global Sources
EE Times-Asia
Stay in touch with EE Times Asia
EE Times-Asia > T&M

Memory test solution supports DDR3, DDR4

Posted: 14 Jul 2010 ?? ?Print Version ?Bookmark and Share

Keywords:memory? test solution? DDR3? DDR4?

V93000 HSM3G memory test solution

Verigy has introduced the V93000 HSM3G high-speed memory test solution that highlights future-ready upgradeability, enabling it to support testing of future generations of DDR memories with data-transfer rates up to 6.8Gbit/s.

It features programmable, at-speed APG per-pin with support for data bus inversion and cyclic redundancy check data generation. Verigy also claims the V93000 HSM3G provides test-time savings of up to 20 percent due to its memory ATE per-pin throughput. It is also said to deliver fully parallel pattern execution, fully parallel DC tests and eye-width measurements. The V93000 HSM3G achieves a native 2.9Gbit/s data rate and true 256-site DDR3 parallel testing over the entire speed range.

Article Comments - Memory test solution supports DDR3, ...
*? You can enter [0] more charecters.
*Verify code:


Visit Asia Webinars to learn about the latest in technology and get practical design tips.

Back to Top