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mTouch conducted noise immunity techniques for the CTMU

Posted: 25 Aug 2010 ?? ?Print Version ?Bookmark and Share

Keywords:CTMU applications? mTouch capacitive touch? noise immunity techniques?

This application note describes the use of special algorithms and techniques with Microchip's Charge Time Measurement Unit (CTMU) for capacitive touch applications in noisy environments. The CTMU is an excellent peripheral for use in touch sensing applications with many benefits such as high scanning speed, charge current trimming and low component count.

Before planning to use capacitive touch interfaces in industrial environments (or any other kind of environment with noisy power supply lines), the user must understand the hazards of conducted noise. Even if regulators keep a constant voltage drop at the circuit input, human interaction couples the noise into the touch pads. The severity of the problem changes depending on the frequency and noise amplitude. In many cases, noise can be countered by heavy signal filtering, but with very long response times.

View the PDF document for more information.

Click here to view related datasheets.





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