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VOICE 2011 Forum on Semiconductor Testing Technologies call for papers

Posted: 21 Sep 2010 ?? ?Print Version ?Bookmark and Share

Keywords:probe card? Flash? SoC? DRAM? IC?

The VOICE 2011 Forum on Semiconductor Testing Technologies is now accepting papers from the international community. Slated at the Chaminade Resort & Spa in Santa Cruz, California, from April 19-21, 2011, the fifth annual VOICE conference will gather Verigy officials and solution partners from around the world for technical presentations, workshops and discussion groups on a wide range of topics, including equipment advances, test techniques and methodologies, engineering effectiveness and cost-efficient solutions for production-volume testing.

Rich Lathrop, senior staff applications engineer at Verigy and chairperson of the conference's steering committee, said attendees will be given previews of the latest high-yield test solutions for SoC, Flash, DRAM and high-speed memory ICs, as well as full-wafer probe card solutions.

Product tutorials and showcases, discussions of emerging device technologies and future test requirements are also among the scheduled activities.

Papers should either be 30-minute short-form presentations or 45-minute long-form presentations. Expert group discussions are also needed for hardware and loadboard solutions, test techniques and methodologies, test engineering effectiveness and production test.

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