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Test coverage analysis tool features yield estimation

Posted: 04 Nov 2010 ?? ?Print Version ?Bookmark and Share

Keywords:test? inspection? debug? estimation?

ASTER Technologies has added a new "yield estimation" feature to its TestWay Express test coverage analysis tool to allow project teams and project leaders to estimate new product yields, as well as allow management to benchmark potential suppliers.

ASTER said TestWay Express provides a better way to ensure a product's quality as it links defects with test coverage using IPC quality metrics.

TestWay Express estimates the production yield in real-time by analyzing the manufacturing defects per million opportunitiesexpressed as parts per millionand tuning the manufacturing test strategy to provide the optimal test coverage to identify the defects for a specific product and minimize the "slip" or "escape rate"a defect slips past the test process and is detected by the end-user.

Theoretical models are used to estimate test coverage for a number of test and inspection strategies, including APM, AOI, AXI, BST, FPT, ICT etc, and Functional Test.

TestWay Express then reads the debugged test program or test report, compares the coverage between the estimated and measured analysis using industry standard metrics, and identifies misalignments.

More than 45 coverage importers are available for test/inspection machines, including Acculogic (BS, Scorpion, SPRINT); Aeroflex (4200, 5800); Agilent Technologies (i1000, i3070, 5DX, SJ10, SJ50); ASSET; CHECKSUM; CORELIS; CyberOptics, DrEschke; GOEPEL (CASCON, OPTICON); JTAG Technologies; Mirtec; MYDATA, OMRON; Orbotech; SAKI; SEICA; SPEA (3030, 4040); TAKAYA (APT8000, APT9000); Teradyne (Z1800, Spectrum, GR228x, TS124); TRI (TR7500, TR8001); VI Technology; VISCOM; XJTAG and YESTech.





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