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Open-Silicon receives patent for TestMAX

Posted: 11 Nov 2010 ?? ?Print Version ?Bookmark and Share

Keywords:scan shift frequency scaling? power dissipation? testing?

Open-Silicon Inc. has received a patent for its TestMAX technology, which was cited for significantly reducing test times and device cost, even as design gate counts grow exponentially and both wafer probe and final test costs increase.

The U.S. Patent and Trademark Office issued Patent No. 7,805,648 to Open-Silicon, which introduced TestMAX to the industry in 2009. TestMAX, which uses scan shift frequency scaling technology, also requires no design changes, is scan-architecture independent, and is applicable to previously taped out designs.

As part of Open-Silicon's MAX Technologies product line, TestMAX profiles the scan vectors for power dissipation first to allow the selection of tests with lower thermal impact and power mesh currents, thereby increasing their frequency.

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