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Cornell innovates on graphene metrology

Posted: 11 Jan 2011 ?? ?Print Version ?Bookmark and Share

Keywords:graphene? metrology? imaging?

Sheets of pure graphene have been identified as a potential material to use as a substitute for chips that are cooler yet faster than today's silicon chips. However, defect-free graphene sheets are very difficult to grow and characterize for defects.

Now, researchers at Cornell University report an imaging technique that simplifies the metrology of graphene sheets by coloring them to quickly identify their properties.

The technique distinguishes the areas of a graphene sheet which are true monolayers by colorizing the edges of perfect patches. Using diffraction imaging electron microscopy, the technique measures the angles at which electrons bounce off a sheet's surface, using different colors to identify them. It produces a colorized image of the sheet that identifies grain boundaries according to their orientation.

The image looks like a patchwork quilt with the large solid areas representing perfect monolayer patches, the colored edges show imperfect boundaries between the patches.

Funding for this research was provided by the U.S. National Science Foundation through the Cornell Center for Materials Research and the Nanoscale Science and Engineering Initiative.

- R. Colin Johnson
EE Times

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