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Meeting test requirements for 40/100 GbE transceivers

Posted: 12 Apr 2011 ?? ?Print Version ?Bookmark and Share

Keywords:Ethernet standards? 40/100 GbE?

Strong user demand is ahead of the development of the latest high speed Ethernet standards. While the physical layer test requirements for the new 40/100 GbE standard have evolved from previous generations, there are a number of new requirements that must be addressed to ensure performance and interoperability. In this article, we will review the updated optical and electrical measurements and testing approaches for this rapidly evolving field.

As the latest generation of high speed communication standards come together, two worlds have emerged. The first is the realm of Ethernet at 40 and 100 Gb/s speeds with traditional NRZ signaling. This is intended to meet the bandwidth requirements of low-cost LAN and metro networks, based on existing technologies. The other is to meet the need among carriers for higher-speed long haul links and incorporate new complex DP-QPSK optical signaling. For this article we will be addressing primarily Ethernet test requirements.

While many of the test procedures will be familiar to designers, the move to 40/100 GbE introduces a number of new test challenges including a new C form-factor pluggable module, 25 Gb/s optical signaling, WDM channels that complicate testing and the use of many more channels and the associated problems with crosstalk. There are also a number of key new measurements including new scaled 25/28G masks, J2/J9 jitter measurements, stressed eye testing and frequency domain channel measurements.

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