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Mobile test app adds TD-LTE tech

Posted: 30 May 2011 ?? ?Print Version ?Bookmark and Share

Keywords:long term evolution? mobile test applications? test driven development?

AT4 wireless has introduced the time division-long term evolution (TD-LTE) personality into the S3110B LTE mobile test application to support all currently-defined test driven development (TDD) frequency bands and bandwidths.

LTE, the primary technology behind 4G which is the evolution of 3G networks, has been envisioned as the future wireless broadband communications standard. From the start, it has been designed to support operation in multiple frequency bands so that it fulfills the regulatory requirements in multiple countries.

While its typical deployments will use paired spectrum, requiring FDD duplex, there are several countries where only unpaired spectrum is available, enforcing the use of the test driven development (TDD) duplex, which presents distinct complexities that require additional testing when compared with feature driven development (FDD), such as multiple DL/UL frame configurations, different options in terms of HARQ feedback and others.

With the inclusion of TD-LTE personality in the S3110B LTE Mobile Test Application, AT4 Wireless claims that they have provided chipset developers and UE integrators not only with a powerful yet easy-to-use testing tool to verify basic RF parameters in multiple PHY configurations and basic signaling procedures, but even to perform end-to-end IP level testing.

The software-based upgrade uses the very same hardware configuration as the LTE FDD signaling personality in the S3110B, sharing the currently-available fading channel emulator and AWGN/OCNG noise-generation capabilities. This means that current customers of the S3110B will have zero downtime when enabling TD-LTE in their units.

According to AT4 Wireless' LTE product manager, Juan P. Hidalgo, TD-LTE has gained traction especially in Asia and in other geographic areas around the world. Thus, with the introduction of the TD-LTE personality in the S3110B, engineers now have a very powerful tool available for fitting their testing needs during most of the device development cycle.

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