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Mentor, Samsung develop net-based critical area analysis

Posted: 07 Jun 2011 ?? ?Print Version ?Bookmark and Share

Keywords:critical care analysis? scan test diagnosis? manufacturing interactions?

Mentor Graphics Corp. together with Samsung Electronics Co. Ltd has developed a new design automation use model for net-based critical area analysis (CAA) and scan test diagnosis to improve chip design yields.

The method combines Mentor's Calibre YieldAnalyzer product and the Tessent test and failure diagnosis tools to better predict chips' yields caused by designCprocess interactions. Silicon defect distributions for the method are derived from a combination of certified foundry defect kits and scan test data.

"Our collaborative efforts with Mentor will allow a significant improvement in our ability to predict and understand yield by analyzing it at the net level," says Kyu-Myung Choi, vice president, infrastructure design center, system LSI division, Samsung, in a statement. "By incorporating CAA and volume scan test diagnosis in our yield analysis process... [allows] us to take faster corrective action and maximize customer yield."

"Our work with Samsung on net-based CAA is a great example of the potential of collaborative efforts with the foundry to improve designers' understanding of design and manufacturing interactions and to increase their overall productivity," says Joseph Sawicki, vice president and general manager of the design-to-silicon division at Mentor.

The net-based CAA solution first leverages certified foundry defect kits and net-based CAA data to help ensure the highest accuracy and granularity of net-level yield predictions prior to manufacturing an IC.

Once in production, the Tessent Diagnosis product leverages layout information and production test results to refine the defect distribution data. This learned defect data is continuously fed back to the net-based CAA process to maintain high accuracy of net level yield predictions even in a highly variable manufacturing environment. This minimizes the PFA (physical failure analysis) cycle time and can be leveraged across the entire product line, according to Mentor.

- Nicolas Mokhoff
??EE Times





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