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Test system targets 3D, 28nm node ICs

Posted: 12 Jul 2011 ?? ?Print Version ?Bookmark and Share

Keywords:test systems? advanced IC designs? 3D? 28nm node?

Verigy Ltd has released a series of scalable, highly cost-efficient tester classes for advanced semiconductor designs. The V93000 Smart Scale Generation of test systems and pin cards targets 3D device architectures and IC designs for the 28nm technology node and beyond.

The Smart Scale series is fully compatible with Verigy's V93000 platform. The smart testers also have advanced per-pin capabilities where each pin can run with its own clock domain, providing full test coverage by matching the exact data rate requirements of the device under test.

The new test systems also feature power supply modulation, jitter injection and protocol communication. These added features enable system-like-stress test to be performed at the ATE level, improving fault-model coverage.

Each of the four Smart Scale tester classesdesignated A, C, S and Lhas a different test head size, enabling Verigy to provide an efficient solution for each user's specific applications.

The company's testing approach delivers greater capabilities in parallel testing and full-performance test solution at wafer sort. These are all critical performance requirements for testing advanced system-on-chip (SoC) devices, system-in-package (SiP) devices and wafer-level chip-scale packages (WLCSPs).

Along with its V93000 Smart Scale testers, Verigy is also launching three digital channel cards.

The Pin Scale 1600 digital card and Pin Scale 1600-ME (memory emulation) card data rates ranging from DC to 1.6Gbps. These cards also double or quadruple the densities of previous pin cards, Verigy said. The highly integrated, small-form-factor cards incorporate Verigy's clock-domain-per-pin, protocol-engine-per-pin, PRBS per pin and SmartLoop testing capabilities for symmetrical high-speed interfaces. In addition, they provide precision DC capabilities and can perform asynchronous testing for high multisite efficiency and concurrent testing.

Verigy's Pin Scale 9G card makes at-speed test affordable. Combining data rates of up to 8Gbps with the same per-pin versatility as the Pin Scale 1600, this card maximizes pin usage while minimizing idle resources. The Pin Scale 9G card supports bi-directional capabilities on all pins and single-ended and differential modes of operation. It can perform both pattern- and pattern-less test to address the majority of testing needs, from parallel I/O testing for design verification to serial physical layer (PHY) testing in high-volume manufacturing.





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