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Upgraded PXI platform cuts test times, costs

Posted: 25 Aug 2011 ?? ?Print Version ?Bookmark and Share

Keywords:IC characterization? production test? parametric measurement? source measure unit?

National Instruments Corp. has expanded the capabilities of its PXI platform for semiconductor characterization and production test with the addition of new per-pin parametric measurement unit (PPMU) modules and source measure unit (SMU) modules.

The NI PXIe-6556 200MHz high-speed digital I/O with PPMU, the NI PXIe-4140 and NI PXIe-4141 four-channel SMUs reduce the cost of capital equipment, decrease test times and increase mixed-signal flexibility for a variety of devices under test.

The NI PXIe-6556 high-speed digital I/O module promises engineers to generate and acquire a digital waveform at up to 200MHz or perform DC parametric measurements with one percent accuracy on the same pin, simplifying cabling, decreasing test times and increasing the density of the tester. In addition, engineers can nearly eliminate timing skew due to different cable and trace lengths to the device under test with the built-in timing calibration feature that automatically adjusts timing for these differences. The NI PXIe-6556 comes with an option to switch in another NI SMU for higher precision, and engineers can trigger parametric measurements based on hardware or software triggers.

The NI PXIe-4140/41 SMU modules provide four SMU channels per PXI Express slot and up to 68 SMU channels per PXI chassis in 4U of rack height to simplify testing of high-pin-count devices. With sampling rates of up to 600,000 samples per second, engineers can reduce measurement times or capture important transient characteristics of the device. Additionally, the NI PXIe-4141 features SourceAdapt technology that engineers can use to custom tune the SMU output response to any given load to achieve maximum stability and minimum transient times. This capability is not possible with traditional SMU technologies.

Combined with NI LabVIEW system design software, these new PPMU and SMU modules add to the modular software-defined approach to semiconductor test by increasing quality, reducing cost and decreasing the time of test across validation, characterization and production.

The NI PXIe-4140, NI PXIe-4141 priced and NI PXIe-6556 are priced at $5,999, $8,999 and $11,299 respectively.

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