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Corelis, NI offer integrated JTAG solution

Posted: 26 Aug 2011 ?? ?Print Version ?Bookmark and Share

Keywords:JTAG solution? boundary-scan test? digital I/O?

Corelis Inc. has released its ScanExpress suite of high-performance JTAG test and measurement tools, which integrates National Instruments Inc.'s (NI) High Speed Digital I/O (HSDIO) instruments. The integration of NI's hardware with Corelis' software provides a seamless path for deploying boundary-scan test and programming capabilities on existing PCI, PXI and PXIe test platforms.

The ScanExpress family of boundary-scan tools offers a fully integrated development environment that includes automatic boundary-scan and at-speed functional test program generation, test program execution with advanced pin-level diagnostics, interactive boundary-scan debugging, and In-System Programming (ISP) of devices such as Flash memories, serial EEPROMs, CPLDs, and FPGAs. The ScanExpress applications are modularized allowing the creation of custom tailored solutions for any user. From full development stations and production-only test stations to field service programming stations, flexible feature sets are available to suit any company's individual requirements.

Block diagram

Block diagram showing PXI-6552 HSDIO instrumentation integration with the Corelis ScanExpress Software family.

Execution based ScanExpress applications such as ScanExpress Runner offer a direct graphical user interface (GUI) to select the PXI/PCI/PXIe-655x series HSDIO instruments as a JTAG controller. Also, ScanExpress

software applications fully integrate with popular National Instruments LabWindows/CVI, LabVIEW, and TestStand platforms through an easy-to-use, high-performance DLL interface.

Managing boundary-scan structural and functional testing with National Instruments software driven test systems has never been easier. And because Corelis' boundary-scan software is compatible with Microsoft

Windows XP, Windows Vista, and Windows 7 operating systems, installation on a NI chassis with a Windows-based embedded controller is a snap.

Boundary-scan integration support is provided for NI's 655x series HSDIO instruments, including the new PXIe-6556 model. In addition to functioning as a digital waveform generator/analyzer for characterizing, validating, and testing digital electronics, integration with ScanExpress tools enables these cards to connect to and control a circuit board's JTAG Test Access Port at voltages as low as 1.2V with test clock speeds up to 30MHz. The ScanExpress software allows users to select NI 655x series cards through the native GUI interface or alternatively by using LabVIEW, LabWindows/CVI, and TestStand with a DLL-based API interface.

"Our customers continue to gain awareness of the value offered by deploying boundary-scan technology earlier in the product design cycleboth as a means to increase efficiency and to improve the bottom line," stated Ryan Jones, Senior Technical Marketing Engineer at Corelis.

"Adding National Instruments hardware product support to Corelis software aligns well with this movement; NI products are already used extensively in the design, development, and test environments. The comfort, convenience, and peace of mind in using familiar equipment help engineers reduce the learning curve when employing JTAG test," Jones added.





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