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Test sol'n improves yield, volume diagnostics

Posted: 26 Sep 2011 ?? ?Print Version ?Bookmark and Share

Keywords:volume diagnostics? yield? test solution?

Synopsys Inc. has enhanced the features of its TetraMAX ATPG and Yield Explorer that the company claims to cut the time, effort and cost of deploying a volume diagnostics flow and speed up yield ramp. The company's test solution enables large volumes of data from design, fab and manufacturing test to meticulously analyze the causes of yield-limiting defects, Synopsys added.

Volume diagnostics are essential for efficiently determining the causes of silicon failures that cut into IC profit margins and impact time-to-quality. Synopsys' enhanced volume diagnostics solution is composed of two products: TetraMAX ATPG identifies potential defects from scan test failures, using physical design data to significantly improve diagnostics accuracy, while Yield Explorer analyzes these potential defects across multiple failing devices to uncover systematic yield issues, also using physical design data to identify specific yield-limiting layout geometries.

In the recent release, TetraMAX ATPG directly connects to Yield Explorer for fast deployment of the solution and improves data throughput for production runs that require massive quantities of design, test and fab data. In addition, new support of industry-standard formats maximizes engineering productivity. LEF/DEF facilitates easy, one-time import of physical design data and STDF V4-2007 enables transfer of defective silicon data from industry-leading testers.

TetraMAX ATPG and Yield Explorer are part of Synopsys' synthesis-based test solution.

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