Global Sources
EE Times-Asia
Stay in touch with EE Times Asia
EE Times-Asia > T&M

Corelis launches advanced JTAG sol'n for Teradyne testers

Posted: 07 Oct 2011 ?? ?Print Version ?Bookmark and Share

Keywords:JTAG? test? in-circuit?

Test and measurement tools supplier Corelis Inc. has released its newest JTAG hardware platform, the USB-1149.1/CFM. Specifically designed for Teradyne GR228x series and TestStation testers, USB-1149.1/CFM can integrate advanced boundary-scan test patterns into Teradyne in-circuit testers. It features IEEE-1149.6 AC-coupled testing, in-system programming, and automatic vector generation.

Using the USB-1149.1/CFM along with the company's ScanExpress family of JTAG software products, Teradyne users gain the benefit of:
???High-speed 100MHz clock rate boundary-scan test support
???JTAG test vector reusability across multiple manufacturing test stations
???Testing of IEEE-1149.6 AC-coupled digital networks
???In-system programming of flash and CPLD devices including direct SPI and I2C support
???Fully automated boundary-scan test vector generation and execution
???A powerful script engine to customize boundary-scan tests

The USB-1149.1/CFM is a single slot Custom Functional Module (CFM) form factor board that installs directly into one of four slots on a Teradyne Custom Function Board (CFB). Integration is simple and transparent; once installed in the system, the USB-1149.1/CFM JTAG, GPIO, I2C, and SPI signals are available to test fixtures and the tester backplane. Integrated SPI and I2C programming features make the USB-1149.1/CFM an ideal and universal solution for combined boundary-scan, JTAG embedded test, and in-system programming applications.

Harrison Miles, director of business development at Corelis, said, "Requirements for boundary-scan solutions will continue to grow as a result of increasing PCB complexities and technology miniaturization. Adding boundary-scan to in-circuit testers represents a logical step for increasing system capability as high-speed buses and accessibility issues continue to become more prevalent."

"The USB-1149.1/CFM is designed specifically to ease boundary-scan deployment with existing Teradyne equipment," adds Ryan Jones, Senior Technical Marketing Engineer at Corelis. "Our solution delivers increased test coverage, faster test times, and lower overall costs, allowing customers to maintain a notable ROI on their Teradyne systems."

Article Comments - Corelis launches advanced JTAG sol'n...
*? You can enter [0] more charecters.
*Verify code:


Visit Asia Webinars to learn about the latest in technology and get practical design tips.

Back to Top