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Distortion measurements with performance spectrum analyzer

Posted: 28 Dec 2011 ?? ?Print Version ?Bookmark and Share

Keywords:performance spectrum analyzer? distortion measurement? continuous wave?

Here is an application note that bridges the gap between primers and data sheets, focusing on distortion measurements using the Agilent Technologies performance spectrum analyzer (PSA) series (model E4440A). Part I is a self-contained section for making the less demanding distortion measurement quickly using the auto-coupled settings found in the PSA. Part II guides the user in setting the appropriate power at the input mixer in order to maximize the dynamic range for carrier wave or continuous wave (CW) measurements. Part III explains the measurement of distortion measurements on digitally modulated signals. Part IV details some of the internal architecture of the PSA as it relates to distortion measurements. Finally, Part V describes some measurement techniques, both internal and external to the PSA, that yield more accuracy in certain kinds of distortion measurements.

View the PDF document for more information.

Originally published by Agilent Technologies Inc. at as "Optimizing Dynamic Range for Distortion Measurements".

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