Global Sources
EE Times-Asia
Stay in touch with EE Times Asia
EE Times-Asia > Optoelectronics/Displays

Fluorescence guided force spectroscopy, recognition imaging with 6000ILM AFM

Posted: 22 Jun 2012 ?? ?Print Version ?Bookmark and Share

Keywords:atomic force microscopy? fluorescence image? imaging?

Here is a demonstration of Agilent 6000ILM's ability to position the atomic force microscopy tip to regions of interest using the contrast enhanced optical image and the fluorescence image, and the subsequent TREC imaging and force spectroscopy. These processes show high correlation among fluorescence intensity, binding probability, and recognition area, as well as the visualization of the recognized nano-domains on cells with different levels of protein expression.

View the PDF document for more information.

Originally published by Agilent Technologies Inc. at as "Fluorescence Guided Force Spectroscopy and Recognition Imaging on Cells Using Agilent's 6000ILM AFM".

Article Comments - Fluorescence guided force spectrosco...
*? You can enter [0] more charecters.
*Verify code:


Visit Asia Webinars to learn about the latest in technology and get practical design tips.

Back to Top