National Instruments extends SMU line

National Instruments has expanded its line of PXI SMUs for automated semiconductor test. Targeted at parallel testing of multipin semiconductor DUTs, the NI PXIe-4143 SMU claim to offer 600kS/s to measure fast transient responses and four channels.

The products expand NI's multichannel SMU output range to 24V at 150mA. Such features help reduce the cost of capital equipment, decrease test times and increase mixed-signal flexibility for a variety of DUTs, indicated the company.

The device feature four-quadrant output, complementing preexisting NI SMU capabilities for sourcing and sinking. It also boasts measurement sensitivity of 10pA and a flexible, compact PXI modular instrumentation architecture for small-footprint equipment deployments, added NI.