Parallel voltage measurements in functional test of car ECUs
Keywords:car? electronics? test coverage?
Another major challenge is to have the best test coverage in order to ensure the system-in-car will never be compromised. The ideal goal is to have the best test coverage with the fastest test times and lowest system costs. What may now be obvious is that conventional functional test method usually force test times and test coverage both to be mutually exclusive. Similarly, each of the components may be mutually exclusive to system costs, making the ideal goal seem impossible with conventional test methods and hardware.
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Originally published by Agilent Technologies Inc. at www.agilent.com as "Implementing Parallel Voltage Measurements in Functional Test of Automotive ECUs".
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