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Start-up focuses on data overload in silicon mfg and test

Posted: 24 Oct 2012 ?? ?Print Version ?Bookmark and Share

Keywords:Qualtera? silicon manufacturing? assembly? Silicondash? decision support system?

Qualtera has announced a technology that according to the company can automatically process and analyse millions of data points on yield and performance for silicon manufacturing and assembly.

Silicondash is an automated decision support system (DSS) for semiconductor test data analysis that runs in a choice of secure data centres, indicated the company.

Even though there are millions of data points, the aim is to reach the required data in four mouse clicks, with each click taking a maximum of two seconds, says Paul Simon, VP marketing and operations, and co-founder of Qualtera. At the same time all the data is kept secure and encrypted, he added.

Currently engineers need to compile test data from multiple sources and then add their own analysis, a process than can take hours or even days. By using Silicondash the analysis and reporting processes are to a large extent automated and can be completed in minutes, noted the company. Very detailed statistical root cause analysis, as well as high-level aggregated summary reports, is accessible in those four clicks.

It is designed to handle all types of test data regardless of product type, data source or volume, providing a real-time, detailed overview of the entire manufactured volume, making it extremely easy to identify, analyse and act on quality or yield issues in manufacturing and test processes.

Silicondash is used in high-volume beta trials with two major European semiconductor IDMs.

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