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Boost measurement integrity in RF/microwave systems

Posted: 26 Nov 2012 ?? ?Print Version ?Bookmark and Share

Keywords:RF? microwave? test systems?

Even though most RF and microwave test systems measure devices within a few wide categoriesamplifiers, transmitters, receiversevery individual system faces a unique set of circumstances, requirements and challenges. As unique as each situation may be, three universal factors interact when you define any RF and microwave test system: performance, speed and repeatability. Within the unique situation each system developer faces, the ability to make trade-offs between these factors is one key to achieving the required level of measurement integrity.

Opportunities to manage these trade-offs can occur at many points along the pathways between the device under test (DUT) and the measurement instruments. This application note suggests a framework for those trade-offs and offers six sets of hints that address common problems that may exist along RF signal pathways.

View the PDF document for more information.

Originally published by Agilent Technologies at www.agilent.com as "6 Hints for Enhancing Measurement Integrity in RF/Microwave Test Systems".





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