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1/f noise measurement system supports 1Hz-10MHz

Posted: 29 Jan 2013 ?? ?Print Version ?Bookmark and Share

Keywords:1/f noise measurement system? IDM? bipolar junction transistor? MOSFET?

ProPlus Design Solutions Inc. has unveiled a wafer-level, 1/f noise measurement system that the company said is geared for foundries, integrated device manufacturers (IDMs) and research organisations. Boasting an industry-proven system architecture as its foundation to ensure highly accurate measurement and a frequency range that exceeds 10MHz, the 9812D has a built-in dynamic signal analyser (DSA) with multi-threaded processing for improved performance and reduced cost, noted the company.

The 9812D increases return on investment by integrating DSA, eliminating the need for expensive external signal processing equipment. This reduces the up-front investment, set-up risk and time. In addition, the device's proprietary technology enables fast, accurate data collection in the range of 1Hz to 10MHz, making the generation of accurate statistical noise models practical.

The 9812D low-frequency 1/f noise measurement system is designed to measure low-frequency noise characteristics of on-wafer or packaged semiconductor devices, including MOSFETs, bipolar junction transistors (BJTs), junction field effect transistors (JFETs), diodes and diffusion resistors.

In addition to frequency domain measurement, 9812D can measure device noise in the time domain and can be used to perform on-wafer auto measurement for flicker (1/f) noise and Radom Telegraph Signal (RTS) analyses.

The system inherited features of 9812B, including the industry's best measurement accuracy. Its accuracy has been tested for all types of technologies, including the most advanced process nodes at 28nm and below and has an extended measurement bandwidth that exceeds 10MHz. 9812D has a true 10MHz bandwidth that can accurately measure 1/f noise without roll off to a much wider frequency than any other solutions.

By integrating a high-performance DSA, the 9812D system delivers high-measurement throughput with three-to-10X improvement over the 9812B. It targets requirements of statistical noise analysis of large amounts of data and 7*24 process monitoring at advanced technologies. The tight DSA integration allows the user to achieve cost-effective, high-performance and high-quality results.

9812D is also the only available system that can take up to 100V from the Source-Measure Unit (SMU) for high-voltage device noise measurement, and has the lowest current level for low-current noise measurement such as MOSFETs under weak inversion conditions.

Unlike other solutions with one built-in voltage low-noise amplifier (LNA), 9812D has multiple built-in voltage and current LNAs. This ensures the highest possible accuracy for low-impedance device under test (DUT).

The NoiseProPlus software drives the noise system and delivers enhanced usability and easier setup for full current-voltage characteristics, 1/f and RTS noise measurement and graphical analysis of measured data. It can control a semiautomatic probe station for multi-die, multi-device and multi-type statistical noise measurements, and has been optimised for fast processing and analysis of massive noise data.

ProPlus Design Systems is accepting orders for 9812D. Shipping will begin in March. Pricing is available upon request.





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