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Suite targets automated wafer-level parameter testing

Posted: 01 Apr 2013 ?? ?Print Version ?Bookmark and Share

Keywords:ACS? wafer-level testing? MOSFET? IGBT?

Keithley Instruments Inc. has improved its Automated Characterisation Suite (ACS) software that is optimised for automated wafer-level parameter test applications such as automated characterisation, reliability analysis and known good die testing. According to the company, the ACS V5.0 update leverages the high power capabilities of Keithley's Model 2651A (high current) and Model 2657A (high voltage) System SourceMeter SMU instruments and is geared for high power semiconductor devices that include power MOSFETs, IGBTs, BJTs and diodes.

The software features high power device libraries designed for Models 2651A (up to 50A or 100A when connecting two units) and 2657A (up to 3kV) System SourceMeter SMU instruments that support testing multi-terminal power components in conjunction with lower power Series 2600B SourceMeter SMU instruments or the Model 4200-SCS Parameter Analyzer to speed and simplify creating modules and sequences for testing power semiconductor devices. It also touts support for hardware scan, recognition and configuration management of the high power Models 2651A and 2657A so users can quickly connect these instruments to a PC, confirm connectivity and begin testing. Additionally, the suite delivers support for Series 2600 SMU instruments equipped with the TSP-Link inter-unit communication bus, leveraging the on-board test script processor (TSP) technology for a multi-processor environment that provides high parallel throughput while speeding and simplifying test project development. Likewise, the suite features support for the 200V C-V capability of the Model 4200-CVU-PWR C-V Power Package option for the Model 4200-SCS Parameter Analyzer to provide a broad range of I-V and C-V measurement capability for full characterisation of semiconductor power components.

ACS V5.0 is available with a number of Keithley characterisation instrument and system configurations.





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