Global Sources
EE Times-Asia
Stay in touch with EE Times Asia
?
EE Times-Asia > T&M
?
?
T&M??

Access+ CUH cuts test floor maintenance time

Posted: 22 Apr 2013 ?? ?Print Version ?Bookmark and Share

Keywords:Multitest? IDMs? contact unit holder? handler kit?

Final test handler manufacturer Multitest has recently launched its new Access+ contact unit holder (CUH) for the MT9510 significantly shortens the downtime of the test cell. The company's new device reduces the time for maintenance on the test floor and directly improves cost of test and return on investment.

The Access+ CUH has been developed for quick and easy access to the contactors, centring plate and adapter board. The number of fixtures to open has been reduced by more than 80 per cent. The new design substantially simplifies the demounting and mounting of the CUH.

The Access+ was developed as a joint effort of Multitest's contacting and handler kit experts. We already have successfully evaluated this new design on the test floor. For customers with an installed base of several MT9510s, the time savings for maintenance can easily add up to several days per year," explained Gerhard Gschwendtberger, Multitest's business unit manager.

Further information regarding the MT9510 can be found here.





Article Comments - Access+ CUH cuts test floor main...
Comments:??
*? You can enter [0] more charecters.
*Verify code:
?
?
Webinars

Seminars

Visit Asia Webinars to learn about the latest in technology and get practical design tips.

?
?
Back to Top