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XRM solution bolsters nanoscale 3D imaging by a factor of 10

Posted: 08 Aug 2013 ?? ?Print Version ?Bookmark and Share

Keywords:Zeiss? X-ray microscopy? nanoscale? tomographies?

Zeiss recently introduced an X-ray microscopy (XRM) solution that increases throughput for three-dimensional imaging at the nanoscale by up to 10 times. The ZEISS Xradia 810 Ultra uses a series of technical innovations to achieve better contrast while also providing faster acquisition.

"As pioneers of nanoscale X-ray imaging at synchrotrons and in prominent research labs worldwide, the next logical step was to optimise XRM for the challenging materials our customers are focusing on today and into the future," says Dr. Kevin Fahey, Chief Materials Scientist at Carl Zeiss X-ray Microscopy. "With the study of medium and low Z materials a major focus throughout the research world, Xradia 810 Ultra makes it more cost-effective and efficient to image a variety of polymers, oxides, composites, some fuel cells, and other materials of interest."

Xradia 810 Ultra operates at 5.4keV, a lower X-ray energy that delivers better contrast and image quality for many materials. Contrast improves as these lower-energy X-rays are absorbed, enabling high-quality tomographies to be completed at reduced imaging times. The company also claims that latest X-ray imaging solution also uses innovative optics, becoming the only lab-based non-destructive imaging solutions to achieve resolution down to 50nm. Along with nanoscale resolution, Xradia 810 Ultra leverages both absorption and Zernike phase contrast and advanced optics adapted from the synchrotron.

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