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Intersil's rad-hard voltage references provide SEL immunity

Posted: 13 Aug 2013 ?? ?Print Version ?Bookmark and Share

Keywords:Intersil? rad-hard? voltage references? telemetry? space?

Intersil Corporation has revealed its latest noise radiation hardened (rad-hard) voltage references. The ISL71090SEH12 and ISL71090SEH25 come in a space saving surface mount packaging and expand Intersil's catalogue of devices for the latest generation of telemetry equipment, data acquisition systems and high-end instrumentation products in space and satellite applications.

Intersil's line of rad hard analogue devices uses an SOI-based PR40 process providing Single Event Latch-up (SEL) immunity to ensure robust performance in heavy ion environments. This and other Ipatented technologies reduce performance compromises in even the most challenging applications.

For example, the ISL71090SEHx voltage references deliver very precise analogue-to-digital conversion, providing initial voltage accuracy of 0.05 per cent, and &plusmn0.15 per cent over the entire military temperature and radiation exposure ranges. This enables support for highly precise A-to-D conversions.

The ISL71090SEHx family also features a very low temperature coefficient of 10ppm/C and an ultra low output noise specification of 2?Vp-p at 2.5Vout, and 1?Vp-p at 1.25Vout. The low output noise reduces disturbances on components measuring precision signals, meeting the stringent DC precision and low noise requirements of critical high-end instrumentation, data acquisition, and processing applications.

The ISL71090SEHx voltage references (1.25V and 2.5V) are available now in a compact 8-lead flatpack. The ISL71090SEH12EV1Z and ISL71090SEH25EV1Z evaluation boards offer two voltage options, 1.25V and 2.5V respectively, and measure the performance of the ISL71090SEHx voltage references.





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