JEDEC outlines proton radiation effects on e-devices

JEDEC Solid State Technology Association has released the JESD234 Test Standard for the Measurement of Proton Radiation Single Event Effects in Electronic Devices. Developed in response to the lack of a prevailing industry standard for proton induced upset testing for electronic devices used in outer space, the standard assists with proton testing in several areas such as pre-trip planning, decision making during the test, and post-exposure planning and analysis.

The standard forewarns the "bounds" to an acceptable proton test covered by this standard. For example, items discussed as being excluded in this standard are low energy proton testing ("The radiation effects test and programmatic community has requested a proton SEE test standard for many years," said Reed Lawrence, chair of the JC-13.4 Subcommittee for Radiation Hardness: Assurance and Characterisation. He added: "JEDEC believes this new standard will meet the community's needs for a test able to simulate the harsh environment of outer space."

The JESD234 is available for free download from the JEDEC website: http://www.jedec.org/standards-documents/results/jesd234.