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Measurement system features expandable architecture

Posted: 28 May 2014 ?? ?Print Version ?Bookmark and Share

Keywords:test? digital? analogue?

Advantest Corp. has unveiled a measurement system that combines digital and analogue testing capabilities to handle small-pin-count analogue, mixed-signal and sensor semiconductors.

The EVA100, an evolutionary value-added platform, has an expandable architecture that supports many scenarios from design to production of analogue, mixed-signal, and sensor ICs. It features an intuitive operation where beginners and experts alike can use the system quickly. It can also generate reports automatically, improving the efficiency of evaluation and measurement tasks.

It is designed for use in both engineering and volume-production environments, allowing simultaneous control of multiple test functions to achieve highly precise measurements and improve testing efficiency.


The integrated test solution features multiple capabilities to support device testing from engineering to the production floor.

The platform integrates analogue-voltage and current-source measurements, an eight-channel 100Mbit/s pattern generator, and an oscilloscope in one compact system. This eliminates the need for complicated cabling to connect and coordinate the various instruments.

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