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Agilent, Cascade simplify wafer-level RFIC testing

Posted: 05 Jun 2014 ?? ?Print Version ?Bookmark and Share

Keywords:wafer-level? test? Agilent? Cascade? RF?

Agilent Technologies and Cascade Microtech, Inc. introduced at the International Microwave Symposium an alliance aimed at providing support for engineers tasked on performing RF measurements, device characterisation and modelling.

Many semiconductor companies integrate Cascade's wafer probers that connect to Agilent's RF/?W test equipment to characterise RFICs while in wafer form. Customers of both companies have been on their own to integrate Agilent's test equipment and Cascades Microtech's probing stations into measurement systems. This alliance can help engineers get a system running in less time because the responsibility will fall to the two companies.

RF testing

Agilent and Cascade Microtech 300mm device characterisation solution.

"Traditionally, wafer-probe companies and test companies have spoken different languages," said Greg Peters, VP/GM of Agilent's Component Test Division at a press conference on June 3. Engineers in need of system-integration help can now start by contacting Cascade Microtech, which will bring in Agilent engineers as needed.

The goal of the program is to guarantee that the measurement systems will have all the needed componentsdown to the cablesand that the systems will be integrated, installed, calibrated, and fully functional. One call will take care of all technical support. Agilent test equipment in these wafer-test systems includes source-measure units, oscilloscopes, spectrum analysers, and network analysers. Agilent's EEsof software serves as the test executive, controlling the instruments and reporting test results.

There is a cost for this integration service. That price, however, is not set. As Peters said, "The cost depends on the value to the customer."

- Martin Rowe
??EE Times





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