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Thermal measurement methodology of RF power amps

Posted: 23 Jun 2014 ?? ?Print Version ?Bookmark and Share

Keywords:Freescale? thermal measurement? RF? power amplifiers? temperature?

This document explains the methodology used by Freescale for thermal measurement of high power RF (Radio Frequency) power amplifiers (RFPA). Semiconductor device reliability heavily depends on device operating temperature so the accurate thermal characterisation of these high power devices is crucial in establishing the reliability of the systems that use such devices.

View the PDF document for more information.

Originally published by Freescale Semiconductor at as "Thermal Measurement Methodology of RF Power Amplifiers".

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