RF/Microwave??
Thermal measurement methodology of RF power amps
Keywords:Freescale? thermal measurement? RF? power amplifiers? temperature?
This document explains the methodology used by Freescale for thermal measurement of high power RF (Radio Frequency) power amplifiers (RFPA). Semiconductor device reliability heavily depends on device operating temperature so the accurate thermal characterisation of these high power devices is crucial in establishing the reliability of the systems that use such devices.
View the PDF document for more information.
Originally published by Freescale Semiconductor at www.freescale.com as "Thermal Measurement Methodology of RF Power Amplifiers".
Related Articles | Editor's Choice |
Article Comments - Thermal measurement methodology of R...
Visitor(To avoid code verification, simply login or register with us. It is fast and free!)
?
Top Ranked Articles
?
Webinars
Visit Asia Webinars to learn about the latest in technology and get practical design tips.